DESCRIPTION
Illustration of an Atomic Force Microscope (AFM) probe tip. AFMs are so sensitive that they can image individual atoms.
DESCRIPTION
Illustration of an Atomic Force Microscope (AFM) probe tip. AFMs are so sensitive that they can image individual atoms.
Credits
Emily Maletz / NISE Network
Developed for the NISE Network with funding from the National Science Foundation under Award Numbers 0532536 and 0940143. Any opinions, findings, and conclusions or recommendations expressed in this product are those of the authors and do not necessarily reflect the views of the Foundation.
Creative Commons Attribution Non-Commercial Share Alike 3.0 United States (CC BY-NC-SA 3.0 US).
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